Facilities

Instrumentation

Instrumentation has been modified or custom designed in order to accommodate the most recent innovations in local measurement probes

Edison Labs	Richards Labs
Digital Dimension 3000 Molecular Imaging Omicron VT AFM/STM	Multimode TIRF/IR Trap Microscope   (based on Nikon TE-2000U) Combined TIRF/AFM
Scanning Impedance Microscopy Nano Impedance Spectroscopy Scanning Gate Microscopy Scanning Conductance Microscopy Piezo Force Microscopy Photon STM Multiple Modulation Imaging CINT Discovery Platform VT Opto electronic Probe Station Nano Gap Electrodes	Fluorescence Imaging at One Nanometer Accuracy (FIONA) Single-Molecule (SM) Fluorescence Polarization Defocussed Orientation and Position Imaging (DOPI) SM Fluorescence Resonance Energy Transfer (SMFRET) Alternating Laser Excitation (ALEX) FRET Modulated Depth TIRF Scanning (MDTIRF??) Combined TIRF and Trap/AFM Interferometric AFM Probe Detection