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Facilities


 

Instrumentation

Instrumentation has been modified or custom designed in order to accommodate the most recent innovations in local measurement probes

Edison Labs Richards Labs
Digital Dimension 3000
Molecular Imaging
Omicron VT AFM/STM

Multimode TIRF/IR Trap Microscope
  (based on Nikon TE-2000U) Combined TIRF/AFM

Scanning Impedance Microscopy

Nano Impedance Spectroscopy

Scanning Gate Microscopy

Scanning Conductance Microscopy

Piezo Force Microscopy

Photon STM

Multiple Modulation Imaging

CINT Discovery Platform

VT Opto electronic Probe Station

Nano Gap Electrodes

Fluorescence Imaging at One Nanometer Accuracy (FIONA)

Single-Molecule (SM) Fluorescence Polarization

Defocussed Orientation and Position Imaging (DOPI)

SM Fluorescence Resonance Energy Transfer (SMFRET)

Alternating Laser Excitation (ALEX) FRET

Modulated Depth TIRF Scanning (MDTIRF??)

Combined TIRF and Trap/AFM

Interferometric AFM Probe Detection